System And Method For Measuring Residual Stress

The present invention is a method and system for determining the residual stress within an elastic object.

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System And Method For Measuring Residual Stress

The present invention is a method and system for determining the residual stress within an elastic object. In the method, an elastic object is cut along a path having a known configuration. The cut creates a portion of the object having a new free surface. The free surface then deforms to a contour which is different from the path. Next, the contour is measured to determine how much deformation has occurred across the new free surface. Points defining the contour are collected in an empirical data set. The portion of the object is then modeled in a computer simulator. The points in the empirical data set are entered into the computer simulator. The computer simulator then calculates the residual stress along the path which caused the points within the object to move to the positions measured in the empirical data set. The calculated residual stress is then presented in a useful format to an analyst.

U.S. Patent No.: 6,470,756 (DOE S-94,763)

Patent Application Filing Date: February 23, 2001

Patent Issue Date: October 29, 2002

Licensing Status:

Available for Express Licensing(?). View terms and a sample license agreement.

For more information, contact Licensing@lanl.gov.


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